High thermal stability and dielectric performance of phenylhydrazine-based Schiff base oligomers obtained via oxidative polycondensation

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dc.contributor.authorSolmaz, Adnan
dc.contributor.authorKaya, Ismet
dc.contributor.authorBayir, Erdal
dc.date.accessioned2026-02-03T12:03:01Z
dc.date.available2026-02-03T12:03:01Z
dc.date.issued2025
dc.departmentÇanakkale Onsekiz Mart Üniversitesi
dc.description.abstractIn this study, the 2-PHMBD Schiff base, synthesized through the condensation of 2,4-dihydroxybenzaldehyde (2,4-DHBA) with phenylhydrazine (PH), was subjected to oxidative polymerization in a basic medium using hydrogen peroxide (H2O2), sodium hypochlorite (NaOCl), and molecular oxygen (O2) as oxidizing agents. Three oligomers, designated as o-(2-PHMBD)-P, o-(2-PHMBD)-H, and o-(2-PHMBD)-O, were successfully obtained and comprehensively characterized by FT-IR, 1H-13C-NMR, UV-Vis, CV, GPC, SEM, TGA, and DSC analyses. Spectroscopic results confirmed the successful polymerization, while morphological and thermal analyses revealed the distinct physical characteristics of the oligomers. According to GPC data, o-(2-PHMBD)-H exhibited the highest average molecular weight of 4700 Da, and TGA analysis demonstrated that o-(2-PHMBD)-O had the highest thermal stability with a residue of 46% at 1000 degrees C. The DSC results showed the highest glass transition temperature of 132 degrees C for o-(2-PHMBD)-H. UV-Vis and CV measurements indicated reduced optical and electrochemical band gaps compared with the monomer, with the lowest optical band gap determined as 2.74 eV. Dielectric measurements revealed that o-(2-PHMBD)-H displayed the highest dielectric constant of 2.57 and conductivity of 2.49 x 10(-)7 S cm(-)1. These results demonstrate that phenylhydrazine-based Schiff base oligomers possess high thermal stability and favorable dielectric properties, making them promising materials for optoelectronic and dielectric device applications.
dc.identifier.doi10.1007/s10854-025-16387-2
dc.identifier.issn0957-4522
dc.identifier.issn1573-482X
dc.identifier.issue36
dc.identifier.scopus2-s2.0-105024748683
dc.identifier.scopusqualityQ2
dc.identifier.urihttps://doi.org/10.1007/s10854-025-16387-2
dc.identifier.urihttps://hdl.handle.net/20.500.12428/34939
dc.identifier.volume36
dc.identifier.wosWOS:001639283300006
dc.identifier.wosqualityQ2
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherSpringer
dc.relation.ispartofJournal of Materials Science-Materials in Electronics
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_WOS_20260130
dc.subjectChelate Polymers
dc.subjectMetal-Complexes
dc.subjectBand-Gap
dc.subjectConductivity
dc.subjectSubstituent
dc.subjectSolubility
dc.subjectCopolymers
dc.titleHigh thermal stability and dielectric performance of phenylhydrazine-based Schiff base oligomers obtained via oxidative polycondensation
dc.typeArticle

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