An Improved Method for Determination of Refractive Index of Dielectric Films from Reflectance Spectrum by Using the Generalized Morse Wavelet

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dc.authorid-en_US
dc.authorid-en_US
dc.authorscopusid55693651100en_US
dc.authorscopusid6603478924en_US
dc.authorwosidAAB-5273-2022en_US
dc.authorwosid-en_US
dc.contributor.authorTiryaki, Erhan
dc.contributor.authorKocahan, Özlem
dc.contributor.authorÖzder, Serhat
dc.date.accessioned2023-07-24T11:51:33Z
dc.date.available2023-07-24T11:51:33Z
dc.date.issued2021en_US
dc.departmentEnstitüler, Lisansüstü Eğitim Enstitüsü, Fizik Ana Bilim Dalı
dc.departmentFakülteler, Fen Fakültesi, Fizik Bölümü
dc.description.abstractThe Generalized Morse Wavelet (GMW) algorithm was adapted to determine the refractive index of dielectric film from the reflectance spectrum. A theoretically generated reflectance spectrum in the range of 300-1200 nm wavelength was analyzed by the Čontinuous Wavelet Transform (ČWT) and the refractive index dispersion was obtained by the mentioned method. In addition, a noisy reflectance spectrum was analyzed to show the advantages of the ČWT method. Refractive index dispersions calculated by the Morlet and the Paul wavelet were compared to GMW at the end of the study.en_US
dc.identifier.citationTiryaki, E., Kocahan, Ö., & Özder, S. (2021). An improved method for determination of refractive index of dielectric films from reflectance spectrum by using the generalized morse wavelet. Measurement Science Review, 21(2), 61-66. doi:10.2478/msr-2021-0009en_US
dc.identifier.doi10.2478/msr-2021-0009
dc.identifier.endpage66en_US
dc.identifier.issn1335-8871
dc.identifier.issue2en_US
dc.identifier.scopus2-s2.0-85107288996
dc.identifier.startpage61en_US
dc.identifier.urihttps://doi.org/10.2478/msr-2021-0009
dc.identifier.urihttps://hdl.handle.net/20.500.12428/4423
dc.identifier.volume21en_US
dc.identifier.wosWOS:000655297700003
dc.identifier.wosqualityQ4
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.institutionauthorTiryaki, Erhan
dc.institutionauthorÖzder, Serhat
dc.language.isoen
dc.publisherSciendoen_US
dc.relation.ispartofMeasurement Science Reviewen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.relation.tubitakinfo:eu-repo/grantAgreement/TUBITAK/SOBAG/115F168
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.rightsAttribution-NonCommercial-NoDerivs 3.0 United States*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/us/*
dc.subjectContinuous wavelet transformen_US
dc.subjectDielectric filmen_US
dc.subjectGeneralized Morse waveleten_US
dc.subjectReflectance spectrumen_US
dc.subjectRefractive indexen_US
dc.titleAn Improved Method for Determination of Refractive Index of Dielectric Films from Reflectance Spectrum by Using the Generalized Morse Wavelet
dc.typeArticle

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