Some physical properties of In doped copper oxide films produced by ultrasonic spray pyrolysis

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dc.authoridAKYUZ, Idris/0000-0002-0880-5028
dc.authoridATAY, FERHUNDE/0000-0001-5650-9146
dc.contributor.authorKose, S.
dc.contributor.authorKetenci, E.
dc.contributor.authorBilgin, V.
dc.contributor.authorAtay, F.
dc.contributor.authorAkyuz, I.
dc.date.accessioned2025-01-27T20:20:28Z
dc.date.available2025-01-27T20:20:28Z
dc.date.issued2012
dc.departmentÇanakkale Onsekiz Mart Üniversitesi
dc.description.abstractIn this work, we have reported the effect of In doping on structural, optical and surface properties of copper oxide films obtained by a low-cost ultrasonic spray pyrolysis technique. Thicknesses, refractive indices and extinction coefficients of the films have been determined by Spectroscopic ellipsometry technique using Cauchy-Urbach model for fitting. A very good agreement was found between experimental and theoretical parameters with low MSE values. Transmission and reflectance spectra have been taken by UV Spectrophotometer, and band gap values have been determined by optical method. Structural properties of the films were investigated with X-ray diffraction patterns. In doping caused the films to growth through some certain directions. Atomic force microscope images have been taken to see the effect of In doping on surface topography and roughness of copper oxide films. Surface properties of undoped films have been improved by In doping. Lowest roughness values have been obtained for In doping at 1%. As a result, we have concluded that properties of copper oxide films which are commonly used in solar cells may have improved by In doping (especially In doped at 1%). (C) 2011 Elsevier B.V. All rights reserved.
dc.description.sponsorshipTUBITAK (The Scientific and Technological Research Council of Turkey) [108T525]
dc.description.sponsorshipThis work was supported by TUBITAK (The Scientific and Technological Research Council of Turkey) under the project number 108T525.
dc.identifier.doi10.1016/j.cap.2011.12.004
dc.identifier.endpage895
dc.identifier.issn1567-1739
dc.identifier.issn1878-1675
dc.identifier.issue3
dc.identifier.scopus2-s2.0-84857458275
dc.identifier.scopusqualityQ2
dc.identifier.startpage890
dc.identifier.urihttps://doi.org/10.1016/j.cap.2011.12.004
dc.identifier.urihttps://hdl.handle.net/20.500.12428/21722
dc.identifier.volume12
dc.identifier.wosWOS:000300715000052
dc.identifier.wosqualityQ2
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherElsevier
dc.relation.ispartofCurrent Applied Physics
dc.relation.publicationcategoryinfo:eu-repo/semantics/openAccess
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_WoS_20250125
dc.subjectUltrasonic spray pyrolysis
dc.subjectCuO:In
dc.subjectSpectroscopic ellipsometry
dc.subjectX-ray diffraction
dc.subjectAFM
dc.titleSome physical properties of In doped copper oxide films produced by ultrasonic spray pyrolysis
dc.typeArticle

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