Preparation and characterization of aluminum-incorporated cadmium oxide films

Basit Öğe Kaydı
dc.authoridATAY, FERHUNDE/0000-0001-5650-9146
dc.authoridAKYUZ, Idris/0000-0002-0880-5028
dc.contributor.authorAkyuz, I.
dc.contributor.authorKose, S.
dc.contributor.authorAtay, F.
dc.contributor.authorBilgin, V.
dc.date.accessioned2025-01-27T20:20:15Z
dc.date.available2025-01-27T20:20:15Z
dc.date.issued2010
dc.departmentÇanakkale Onsekiz Mart Üniversitesi
dc.description.abstractOpto-electronic and photovoltaic solar cell technologies which are developing day by day need novel and alternative materials. Also, economic cost is the other important parameter when producing and using these materials. With this purpose, we have prepared aluminum-incorporated CdO films by ultrasonic spray pyrolysis (USP) technique. Firstly, elemental analyses were performed to observe the distribution rate of Al in the structure. We have attempted to explain the structural and electrical properties of these films in detail. The crystalline structure was studied by X-ray diffraction (XRD). Besides, some structural parameters such as texture coefficient, grain size and dislocation density were calculated. Van der Pauw and Hall measurements were used to investigate the electrical properties. Electrical conductivity, carrier concentration and mobility values were determined for all films. Finally, we conclude that Al-incorporated CdO films with low Al concentrations will be promising materials for future works because of their high conductivity and mobility values as compared to others. (C) 2010 Elsevier Ltd. All rights reserved.
dc.identifier.doi10.1016/j.mssp.2010.05.006
dc.identifier.endpage114
dc.identifier.issn1369-8001
dc.identifier.issn1873-4081
dc.identifier.issue2
dc.identifier.scopus2-s2.0-77955472911
dc.identifier.scopusqualityQ1
dc.identifier.startpage109
dc.identifier.urihttps://doi.org/10.1016/j.mssp.2010.05.006
dc.identifier.urihttps://hdl.handle.net/20.500.12428/21637
dc.identifier.volume13
dc.identifier.wosWOS:000288520400007
dc.identifier.wosqualityQ3
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherElsevier Sci Ltd
dc.relation.ispartofMaterials Science in Semiconductor Processing
dc.relation.publicationcategoryinfo:eu-repo/semantics/openAccess
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_WoS_20250125
dc.subjectSemiconductors
dc.subjectX-ray diffraction
dc.subjectElectrical properties
dc.titlePreparation and characterization of aluminum-incorporated cadmium oxide films
dc.typeArticle

Dosyalar

Koleksiyon

WoS İndeksli Yayınlar Koleksiyonu
Scopus İndeksli Yayınlar Koleksiyonu