Refractive index and extinction coefficient determination of an absorbing thin film by using the continuous wavelet transform method

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dc.authoridSEL, Kivanc/0000-0002-4623-5206
dc.authoridCoskun, Emre/0000-0002-6820-3889
dc.contributor.authorCoskun, Emre
dc.contributor.authorSel, Kivanc
dc.contributor.authorOzder, Serhat
dc.contributor.authorKurt, Mustafa
dc.date.accessioned2025-01-27T20:25:06Z
dc.date.available2025-01-27T20:25:06Z
dc.date.issued2008
dc.departmentÇanakkale Onsekiz Mart Üniversitesi
dc.description.abstractWe present the continuous wavelet transform (CWT) method for determining the dispersion curves of the refractive index and extinction coefficient of absorbing thin films by using the transmittance spectrum in the visible and near infrared regions at room temperature. The CWT method is performed on the transmittance spectrum of an a - Si1-xCx:H film, and the refractive index and extinction coefficient of the film are continuously determined and compared with the results of the envelope and fringe counting methods. Also the noise filter property of the method is depicted on a theoretically generated noisy signal. Finally, the error analyses of the CWT, envelope, and fringe counting methods are performed. (C) 2008 Optical Society of America
dc.description.sponsorshipTurkish Scientific and Technological Research Counci [105T136]
dc.description.sponsorshipThis research was supported by the Turkish Scientific and Technological Research Council (TUBITAKTBAG 105T136).
dc.identifier.doi10.1364/AO.47.004888
dc.identifier.endpage4894
dc.identifier.issn1559-128X
dc.identifier.issn2155-3165
dc.identifier.issue27
dc.identifier.pmid18806848
dc.identifier.scopus2-s2.0-56849111003
dc.identifier.scopusqualityQ2
dc.identifier.startpage4888
dc.identifier.urihttps://doi.org/10.1364/AO.47.004888
dc.identifier.urihttps://hdl.handle.net/20.500.12428/22431
dc.identifier.volume47
dc.identifier.wosWOS:000260194100010
dc.identifier.wosqualityQ2
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.indekslendigikaynakPubMed
dc.language.isoen
dc.publisherOptical Soc Amer
dc.relation.ispartofApplied Optics
dc.relation.publicationcategoryinfo:eu-repo/semantics/openAccess
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_WoS_20250125
dc.subjectDispersion
dc.subjectTurbulence
dc.subjectThickness
dc.titleRefractive index and extinction coefficient determination of an absorbing thin film by using the continuous wavelet transform method
dc.typeArticle

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