Investigation of structural and optical parameters of Cu-Ag-In-Se thin films deposited by thermal evaporation method

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dc.authoridCandan, Idris/0000-0002-9950-713X
dc.authoridGullu, Hasan Huseyin/0000-0001-8541-5309
dc.authoridCoskun, Emre/0000-0002-6820-3889
dc.contributor.authorGullu, H. H.
dc.contributor.authorCandan, I.
dc.contributor.authorCoskun, E.
dc.contributor.authorParlak, M.
dc.date.accessioned2025-01-27T20:27:31Z
dc.date.available2025-01-27T20:27:31Z
dc.date.issued2015
dc.departmentÇanakkale Onsekiz Mart Üniversitesi
dc.description.abstractAnnealing effect on the structural and optical properties of the quaternary Cu-Ag-In-Se thin film deposited by the thermal evaporation has been investigated. The evaporation source was prepared by using vertical Bridgman-Stockbarger crystal growth system. Structural analysis indicated that annealing the films following to the deposition resulted in the changes from amorphous to polycrystalline phase with the preferred orientation along (1 1 2) direction. In order to determine the optical properties of the thin films as a function of annealing temperature, the transmission measurements were carried out in between 300 and 2000 nm. The optical band gap values were lying in between 1.29 and 1.50 eV upon annealing the thin films in the temperature range of 300-500 degrees C. The refractive indices of the samples were in the range of 2.7-3.8 depending on the wavelength region and annealing temperature by applying the Envelope Method. The other optical constants of the samples were also calculated using Cauchy Method and Single Oscillator Model. (C) 2015 Elsevier GmbH. All rights reserved.
dc.description.sponsorshipMiddle East Technical University (METU-BAP) [BAP-01-05-2013-005]; TUBITAK-BIDEB
dc.description.sponsorshipThis work was financed by Middle East Technical University (METU-BAP) under Grant No. BAP-01-05-2013-005. Also, one of the authors would like to thank to TUBITAK-BIDEB for the financial supports during this study.
dc.identifier.doi10.1016/j.ijleo.2015.05.026
dc.identifier.endpage1583
dc.identifier.issn0030-4026
dc.identifier.issn1618-1336
dc.identifier.issue18
dc.identifier.scopus2-s2.0-84944053695
dc.identifier.scopusqualityQ1
dc.identifier.startpage1578
dc.identifier.urihttps://doi.org/10.1016/j.ijleo.2015.05.026
dc.identifier.urihttps://hdl.handle.net/20.500.12428/22710
dc.identifier.volume126
dc.identifier.wosWOS:000364272300006
dc.identifier.wosqualityQ4
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherElsevier Gmbh
dc.relation.ispartofOptik
dc.relation.publicationcategoryinfo:eu-repo/semantics/openAccess
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_WoS_20250125
dc.subjectThin film
dc.subjectChalcogenide
dc.subjectVapor deposition
dc.subjectX-ray diffraction
dc.subjectOptical properties
dc.titleInvestigation of structural and optical parameters of Cu-Ag-In-Se thin films deposited by thermal evaporation method
dc.typeArticle

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