Optical characterization and determination of carrier density of ultrasonically sprayed CdS:Cu films

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dc.authoridATAY, FERHUNDE/0000-0001-5650-9146
dc.authoridAKYUZ, Idris/0000-0002-0880-5028
dc.contributor.authorKose, S.
dc.contributor.authorAtay, F.
dc.contributor.authorBilgin, V.
dc.contributor.authorAkyuz, I.
dc.contributor.authorKetenci, E.
dc.date.accessioned2025-01-27T21:01:57Z
dc.date.available2025-01-27T21:01:57Z
dc.date.issued2010
dc.departmentÇanakkale Onsekiz Mart Üniversitesi
dc.description.abstractIn this work, CdS and Cu doped CdS films (at the Cu percentages of 1, 3 and 5) have been deposited onto glass substrates at 350 + 5 degrees C by ultrasonic spray pyrolysis technique and their application potential for photovoltaic solar cells have been investigated. Optical properties and thicknesses of the films have been investigated by spectroscopic ellipsometry (SE). Ellipsometric angle psi was used as the source point for optical characterizations. The optical constants (n and k) and the thicknesses of the films have been fitted according to Cauchy model. Also, optical properties of the produced films have been analyzed by transmittance and reflectance spectra. Refractive index (n), extinction coefficient (k) and reflectance (R) spectra have been taken by spectroscopic ellipsometer, while transmittance spectra have been taken by UV/vis spectrophotometer. The optical method has been used to determine the band gap type and value of the films. Mott-Schottky (M-S) measurements have been made to determine the conductivity type and carrier concentration of the films. Samples showed n-type conductivity and carrier concentration of undoped CdS sample was found to be 1.19 x 10(19) cm(-3). Also, it was concluded that Cu doping has an acceptor effect in CdS samples. From the results of these investigations, the application potential of CdS: Cu films for photovoltaic solar cells as window layer was searched. (C) 2010 Elsevier B. V. All rights reserved.
dc.description.sponsorshipEskisehir Osmangazi University [200719011]
dc.description.sponsorshipThis work was supported by Eskisehir Osmangazi University Scientific Research Fund under the project number 200719011. We thank to Betul Guzeldir, Hatice Asil and Kubra Cinar from Ataturk University for their help in taking M-S measurements.
dc.identifier.doi10.1016/j.apsusc.2010.02.018
dc.identifier.endpage4303
dc.identifier.issn0169-4332
dc.identifier.issn1873-5584
dc.identifier.issue13
dc.identifier.scopus2-s2.0-77950520826
dc.identifier.scopusqualityQ1
dc.identifier.startpage4299
dc.identifier.urihttps://doi.org/10.1016/j.apsusc.2010.02.018
dc.identifier.urihttps://hdl.handle.net/20.500.12428/27240
dc.identifier.volume256
dc.identifier.wosWOS:000276492300042
dc.identifier.wosqualityQ2
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherElsevier
dc.relation.ispartofApplied Surface Science
dc.relation.publicationcategoryinfo:eu-repo/semantics/openAccess
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_WoS_20250125
dc.subjectUltrasonic spray pyrolysis
dc.subjectCdS:Cu films
dc.subjectSpectroscopic ellipsometry
dc.subjectOptical characterization
dc.subjectMott-Schottky measurements
dc.titleOptical characterization and determination of carrier density of ultrasonically sprayed CdS:Cu films
dc.typeArticle

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