Identification of intrinsic deep level defects responsible for electret behavior in T1GaSe2 layered semiconductor

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dc.authoridOdrinsky, Andrey/0000-0003-2814-9168
dc.contributor.authorSeyidov, MirHasan Yu
dc.contributor.authorMikailzade, Faik A.
dc.contributor.authorUzun, Talip
dc.contributor.authorOdrinsky, Andrei P.
dc.contributor.authorYakar, Emin
dc.contributor.authorAliyeva, Vafa B.
dc.contributor.authorBabayev, Sardar S.
dc.date.accessioned2025-01-27T20:24:24Z
dc.date.available2025-01-27T20:24:24Z
dc.date.issued2016
dc.departmentÇanakkale Onsekiz Mart Üniversitesi
dc.description.abstractUnusual behavior of pyroelectric current signal polarity near the Curie point ( T-c) was observed for TIGaSe2 a ferroelectric-semiconductor. It has been revealed that the polarity of the spontaneous polarization near T-c depends on the sample poling prehistory. In particular, applying an external electric field only in the temperature range of the paraelectric state during cooling regime in darkness brought to the depolarization current at I with the sign opposite to the external field polarity. Otherwise, if the sample was poled in the temperature interval of the incommensurate phase, pyroelectric current exhibits a peak at T-c with the polarity that is the same as for the external poling electric field. These observations indicate that internal electric field is present in the bulk and near-surface layer regions of the electrically poled single crystal TIGaSe2. Possible mechanisms and origins responsible for the internal electric fields in TIGaSe2 are discussed. It is shown that the formation of internal electric fields in TIGaSe2 is due to charging of intrinsic native defects during the poling process. Characteristics of electrically active intrinsic defects in TIGaSe2 were investigated by using of Photo-Induced Current Transient Spectroscopy (PICTS) technique. Six deep defect levels in the band gap of TIGaSe2 were determined, which were localized both in the bulk and on the surface of the sample and could be electrically charged. The correlation between polarization effects and PICTS results has been established. It was shown that native deep defects (A3-A6) localized in the bulk of crystal are responsible for hetero-charge formation and negative sign of the pyroelectric current peak observed around the Curie temperature after poling the sample in the temperature intervals well above I. It was also shown that the positive sign pyrocurrent observed near the Curie point is attributed to the homo-charge formed by native A2-trapping centers which are localized near the surface region of TIGaSe2. Native deep level trap having an activation energy of 0.26 eV and the capture cross section of 2.8 x 10(-13) cm(2) were established for A2 from PICTS measurements. (C) 2015 Elsevier B.V. All rights reserved.
dc.description.sponsorshipbilateral programme RFBR - TUBITAK [213M524, 14-02-91374 CT_a]
dc.description.sponsorshipThe authors would like to acknowledge the support through the bilateral programme RFBR (14-02-91374 CT_a) - TUBITAK (No. 213M524).
dc.identifier.doi10.1016/j.physb.2015.12.004
dc.identifier.endpage89
dc.identifier.issn0921-4526
dc.identifier.issn1873-2135
dc.identifier.scopus2-s2.0-84951068544
dc.identifier.scopusqualityQ2
dc.identifier.startpage82
dc.identifier.urihttps://doi.org/10.1016/j.physb.2015.12.004
dc.identifier.urihttps://hdl.handle.net/20.500.12428/22206
dc.identifier.volume483
dc.identifier.wosWOS:000368267200015
dc.identifier.wosqualityQ3
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherElsevier
dc.relation.ispartofPhysica B-Condensed Matter
dc.relation.publicationcategoryinfo:eu-repo/semantics/openAccess
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_WoS_20250125
dc.subjectphoto - induced current transient spectroscopy
dc.subjectpyroelectric current
dc.subjectdeep level defects
dc.subjectincommensurate phase
dc.titleIdentification of intrinsic deep level defects responsible for electret behavior in T1GaSe2 layered semiconductor
dc.typeArticle

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