Simultaneous determination of the thickness and refractive index dispersion of dielectric films by the Paul wavelet transform
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Tarih
2019
Dergi Başlığı
Dergi ISSN
Cilt Başlığı
Yayıncı
Elsevier Science Sa
Erişim Hakkı
info:eu-repo/semantics/closedAccess
Özet
The continuous wavelet transform with Paul wavelet was proposed as a method for the simultaneous determination of physical thickness and refractive index dispersion of dielectric films in the visible and near infrared region. Transmittance spectrums, acquired at two different incident angles, were used for the calculations. By this way refractive index dispersion was obtained without knowing the film thickness. The method was tested with simulated data and experimentally applied to a sample of borosilicate glass. The obtained thickness and refractive index dispersion values were compared to the values obtained by the envelope method and the ones provided by the manufacturer.
Açıklama
Anahtar Kelimeler
Dielectric films, Physical thickness, Refractive index dispersion, Transmittance spectrum
Kaynak
Thin Solid Films
WoS Q Değeri
Q3
Scopus Q Değeri
Q2
Cilt
692
