Determination of the refractive index of a dielectric film continuously by the generalized S-transform
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Tarih
2010
Yazarlar
Dergi Başlığı
Dergi ISSN
Cilt Başlığı
Yayıncı
Optical Soc Amer
Erişim Hakkı
info:eu-repo/semantics/closedAccess
Özet
The generalized S-transform was improved as a method to determine the refractive index of a dielectric film continuously by using the transmittance spectrum, and the applicability of the method was demonstrated on mica. The result determined from the generalized S-transform method was compared with the results determined from the S-transform and the fringe counting methods and published values. The advantage of the proposed method was explained, and the absolute error of the presented method was also calculated. (c) 2010 Optical Society of America
Açıklama
Anahtar Kelimeler
Thickness, Wavelength
Kaynak
Optics Letters
WoS Q Değeri
Q1
Scopus Q Değeri
Q1
Cilt
35
Sayı
6
