Some physical properties of copper oxide films: The effect of substrate temperature

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dc.authoridAKYUZ, Idris/0000-0002-0880-5028
dc.authoridATAY, FERHUNDE/0000-0001-5650-9146
dc.contributor.authorKose, S.
dc.contributor.authorAtay, F.
dc.contributor.authorBilgin, V.
dc.contributor.authorAkyuz, I.
dc.date.accessioned2025-01-27T21:03:53Z
dc.date.available2025-01-27T21:03:53Z
dc.date.issued2008
dc.departmentÇanakkale Onsekiz Mart Üniversitesi
dc.description.abstractIn this work, copper oxide films were deposited at different substrate temperatures of 200, 250, 300 and 350+/-5 degrees C by ultrasonic spray pyrolysis technique and the effect of substrate temperature on the structural, surface, optical and electrical properties of the films was presented. The film structures were studied by X-ray diffraction (XRD). To obtain information about structural properties in detail, the grain size (D), dislocation density (delta) and lattice parameters (a = b = c for cubic structure) for preferential orientations were calculated. The surface properties and elemental analyses were characterised using scanning electron microscopy and energy dispersive X-ray spectroscopy, respectively. Optical properties of the films were analyzed by transmission, linear absorption coefficient and reflection spectra, and the optical method was used to determine the band gaps of the films. The current-voltage values were measured with two-probe technique, and the electrical conductivities were calculated. Consequently, it was determined that substrate temperature has a strong effect on the structural, surface, optical and electrical properties of copper oxide films. (C) 2008 Elsevier B.V. All rights reserved.
dc.description.sponsorshipOsmangazi University Scientific Research [200419031]
dc.description.sponsorshipThis work was supported by Osmangazi University Scientific Research Projects Committee under the project number 200419031.
dc.identifier.doi10.1016/j.matchemphys.2008.04.025
dc.identifier.endpage358
dc.identifier.issn0254-0584
dc.identifier.issue2-3
dc.identifier.scopus2-s2.0-47749107549
dc.identifier.scopusqualityQ1
dc.identifier.startpage351
dc.identifier.urihttps://doi.org/10.1016/j.matchemphys.2008.04.025
dc.identifier.urihttps://hdl.handle.net/20.500.12428/27482
dc.identifier.volume111
dc.identifier.wosWOS:000258964300033
dc.identifier.wosqualityQ2
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherElsevier Science Sa
dc.relation.ispartofMaterials Chemistry and Physics
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_WoS_20250125
dc.subjectthin films
dc.subjectoptical properties
dc.subjectelectrical characterisation
dc.subjectelectron microscopy
dc.titleSome physical properties of copper oxide films: The effect of substrate temperature
dc.typeArticle

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