Thin film characterization of novel phthalimide materials

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dc.authoridCapan, Rifat/0000-0003-3222-9056
dc.contributor.authorSen, S.
dc.contributor.authorCapan, R.
dc.contributor.authorOzel, M. E.
dc.contributor.authorHassan, A. K.
dc.contributor.authorTurhan, O.
dc.contributor.authorNamli, H.
dc.date.accessioned2025-01-27T20:52:10Z
dc.date.available2025-01-27T20:52:10Z
dc.date.issued2011
dc.departmentÇanakkale Onsekiz Mart Üniversitesi
dc.description.abstractSpin coating technique is employed to produce thin phthalimide films using novel p-phthalimidobenzoic acid (FIBA) and N-(phthalimido)-p-aminobenzoic acid (FIABA) materials. Several spin speeds and various solution concentrations are chosen to monitor the thin film deposition process of these new materials. The optical properties are studied using UV-visible spectroscopy and spectroscopic ellipsometry methods. The absorption of the FIBA and FIABA films against the spin speed showed an exponential behavior. pi -> pi* transition is occurred. The thicknesses of thin films at 2000 rpm are obtained 15.86 nm for FIBA and 12.99 nm for FIABA using spectroscopic ellipsometry results.
dc.description.sponsorshipOnsekiz Mart University Research Council Foundation [2005/111]
dc.description.sponsorshipThis work was supported by Onsekiz Mart University Research Council Foundation under Project number 2005/111.
dc.identifier.endpage1247
dc.identifier.issn1842-6573
dc.identifier.issn2065-3824
dc.identifier.issue11
dc.identifier.scopus2-s2.0-83455181806
dc.identifier.scopusqualityQ4
dc.identifier.startpage1243
dc.identifier.urihttps://hdl.handle.net/20.500.12428/25682
dc.identifier.volume5
dc.identifier.wosWOS:000298850300025
dc.identifier.wosqualityQ4
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherNatl Inst Optoelectronics
dc.relation.ispartofOptoelectronics and Advanced Materials-Rapid Communications
dc.relation.publicationcategoryinfo:eu-repo/semantics/openAccess
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_WoS_20250125
dc.subjectPhthalimides
dc.subjectSpun films
dc.subjectUV-vis Spectroscopy
dc.subjectSpectroscopic ellipsometry
dc.titleThin film characterization of novel phthalimide materials
dc.typeArticle

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