Optical characterization of SnO2:F films by spectroscopic ellipsometry

Basit Öğe Kaydı
dc.authoridAKYUZ, Idris/0000-0002-0880-5028
dc.authoridATAY, FERHUNDE/0000-0001-5650-9146
dc.contributor.authorAtay, F.
dc.contributor.authorBilgin, V.
dc.contributor.authorAkyuz, I.
dc.contributor.authorKetenci, E.
dc.contributor.authorKose, S.
dc.date.accessioned2025-01-27T20:49:47Z
dc.date.available2025-01-27T20:49:47Z
dc.date.issued2010
dc.departmentÇanakkale Onsekiz Mart Üniversitesi
dc.description.abstractSpectroscopic ellipsometry (SE), which is a non-destructive and a non-contact optical technique used in characterization of thin films, is widely used to determine thickness, microstructure and optical constants. In this work, the effect of F incorporation on optical properties of SnO2 films grown by ultrasonic spray pyrolysis technique (USP) is presented. The reflections, refractive indices and thicknesses of the films were investigated using room temperature spectroscopic ellipsometry. The optical constants and the thicknesses of the films were fitted according to Cauchy-Urbach model, and ellipsometric angle psi was used as source point for optical characterizations. Besides, transmittance spectra of the films were taken from UV spectrometer, and the optical method was used to determine the band gaps. Also, band tailing resulting from defects or impurities was investigated. From the results obtained from the optical analyses, the application potential of SnO2:F films for solar cell devices was searched. (C) 2010 Elsevier B.V. All rights reserved.
dc.description.sponsorshipEskisehir Osmangazi University [200719011]
dc.description.sponsorshipThis work was supported by Eskisehir Osmangazi University Scientific Research Projects Committee under the project number 200719011.
dc.identifier.doi10.1016/j.jnoncrysol.2010.07.007
dc.identifier.endpage2197
dc.identifier.issn0022-3093
dc.identifier.issn1873-4812
dc.identifier.issue41-42
dc.identifier.scopus2-s2.0-77957154300
dc.identifier.scopusqualityQ1
dc.identifier.startpage2192
dc.identifier.urihttps://doi.org/10.1016/j.jnoncrysol.2010.07.007
dc.identifier.urihttps://hdl.handle.net/20.500.12428/25312
dc.identifier.volume356
dc.identifier.wosWOS:000283475800018
dc.identifier.wosqualityQ1
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherElsevier Science Bv
dc.relation.ispartofJournal of Non-Crystalline Solids
dc.relation.publicationcategoryinfo:eu-repo/semantics/openAccess
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_WoS_20250125
dc.subjectSnO2:F films
dc.subjectUltrasonic spray pyrolysis
dc.subjectSpectroscopic ellipsometry (SE)
dc.subjectUV
dc.titleOptical characterization of SnO2:F films by spectroscopic ellipsometry
dc.typeArticle

Dosyalar

Koleksiyon

WoS İndeksli Yayınlar Koleksiyonu
Scopus İndeksli Yayınlar Koleksiyonu