Structural and optical properties of Zn-In-Te thin films deposited by thermal evaporation technique

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dc.authoridGullu, Hasan Huseyin/0000-0001-8541-5309
dc.authoridCandan, Idris/0000-0002-9950-713X
dc.authoridSURUCU, Ozge/0000-0002-8478-1267
dc.authoridCoskun, Emre/0000-0002-6820-3889
dc.contributor.authorGullu, H. H.
dc.contributor.authorBayrakli, O.
dc.contributor.authorCandan, I.
dc.contributor.authorCoskun, E.
dc.contributor.authorParlak, M.
dc.date.accessioned2025-01-27T20:50:33Z
dc.date.available2025-01-27T20:50:33Z
dc.date.issued2013
dc.departmentÇanakkale Onsekiz Mart Üniversitesi
dc.description.abstractAnnealing effects on structural and optical properties of the thermally evaporated Zn-In-Te(ZIT) thin films have been investigated. The structural and the compositional analyses were carried out by means of X-ray diffraction (XRD) and energy dispersive X-ray analysis (EDXA). The as-grown and annealed ZIT films had polycrystalline structure and the preferred orientation changed from (220) to (112) direction with increasing annealing temperature. The optical properties and constants were determined by transmittance measurements in the wavelength range of 200-2000 nm. The effect of annealing on the optical parameters was determined by using Single Oscillator Model (SOM), Envelope Model (EM) and Cauchy Method. The absorbance studies revealed that the films had three distinct transitions in the high absorption region because of the tetragonal distortion, and that was used to evaluate the splitting energies of crystal-field and spin-orbit splitting. The fundamental optical band gap values were found to be lying in the range of 1.51 and 1.72 eV and the notable change of the band gaps due to annealing temperatures was observed. Finally, the Urbach energies were calculated and it was observed that the band tail energies were increasing with increasing annealing temperature. (C) 2013 Elsevier B. V. All rights reserved.
dc.description.sponsorshipMiddle East Technical University (METU-BAP) [BAP-01-05-2012-004]; TUBITAK-BIDEB
dc.description.sponsorshipThis work was financed by Middle East Technical University (METU-BAP) under Grant No. BAP-01-05-2012-004. Also, one of the authors would like to thank to TUBITAK-BIDEB for the financial supports during this study.
dc.identifier.doi10.1016/j.jallcom.2013.03.030
dc.identifier.endpage89
dc.identifier.issn0925-8388
dc.identifier.scopus2-s2.0-84875951991
dc.identifier.scopusqualityQ1
dc.identifier.startpage83
dc.identifier.urihttps://doi.org/10.1016/j.jallcom.2013.03.030
dc.identifier.urihttps://hdl.handle.net/20.500.12428/25519
dc.identifier.volume566
dc.identifier.wosWOS:000317817200015
dc.identifier.wosqualityQ1
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherElsevier Science Sa
dc.relation.ispartofJournal of Alloys and Compounds
dc.relation.publicationcategoryinfo:eu-repo/semantics/openAccess
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_WoS_20250125
dc.subjectThin films
dc.subjectOptical properties
dc.subjectCrystal structure
dc.subjectOptical spectroscopy
dc.subjectX-ray diffraction
dc.titleStructural and optical properties of Zn-In-Te thin films deposited by thermal evaporation technique
dc.typeArticle

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