Preparation and Characterization of Polycrystalline CdS Thin Films Deposited by Chemical Bath Deposition

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dc.authoridDemir, Ramazan/0000-0003-4130-4927
dc.contributor.authorDemir, Ramazan
dc.contributor.authorGode, Fatma
dc.date.accessioned2025-01-27T20:27:19Z
dc.date.available2025-01-27T20:27:19Z
dc.date.issued2018
dc.departmentÇanakkale Onsekiz Mart Üniversitesi
dc.description.abstractCadmium sulfide (CdS) thin films are deposited on microscope glass substrates at 82 +/- 2 degrees C for 1 h using chemical bath deposition technique. Deposited films are annealed at 350 degrees C for 1 h in air atmosphere. Their structural, morphological, compositional analysis and optical properties are studied by X-ray diffraction (XRD), scanning electron microscope (SEM), energy dispersive X-ray spectroscopy (EDS) and UV-Vis spectrophotometer, respectively. The XRD patterns show that both deposited and annealed CdS films have hexagonal structure with preferred orientation along the (0 0 2) plane. The grain size of the deposited film increases with annealing. The optical properties of the films are determined by measuring transmittance and absorbance spectra which are used to evaluate the optical band gap, refractive index, real and imaginary parts of dielectric constant. The band gap of the film decreases from 2.06 eV to 1.95 eV with annealing. Currentvoltage (IV) measurements are also carried out in the dark for as-grown and annealed films. The electrical conductivity of the film increases from 2.12 x 10 (11) (Omega cm)(1) to 2.02 x 10 1 (10) (Omega cm)(1) after heat treatment. An increment in electrical conductivity of the film after annealing process can be attributed to an increase in electron density and mobility, as well as an increment in grain size
dc.identifier.doi10.1166/mat.2018.1525
dc.identifier.endpage355
dc.identifier.issn2169-429X
dc.identifier.issn2169-4303
dc.identifier.issue3
dc.identifier.startpage351
dc.identifier.urihttps://doi.org/10.1166/mat.2018.1525
dc.identifier.urihttps://hdl.handle.net/20.500.12428/22656
dc.identifier.volume7
dc.identifier.wosWOS:000433126200008
dc.identifier.wosqualityN/A
dc.indekslendigikaynakWeb of Science
dc.language.isoen
dc.publisherAmer Scientific Publishers
dc.relation.ispartofMaterials Focus
dc.relation.publicationcategoryinfo:eu-repo/semantics/openAccess
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_WoS_20250125
dc.subjectX-ray Diffraction
dc.subjectScanning Electron Microscopy
dc.subjectThin Films
dc.subjectGrowth from Solutions
dc.titlePreparation and Characterization of Polycrystalline CdS Thin Films Deposited by Chemical Bath Deposition
dc.typeArticle

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