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    An Improved Method For Determination Of Refractive Index Of Absorbing Films: A Simulation Study
    (Amer Inst Physics, 2017) Ozcan, Seckin; Coskun, Emre; Kocahan, Ozlem; Ozder, Serhat
    In this work an improved version of the method presented by Gandhi was presented for determination of refractive index of absorbing films. In this method local maxima of consecutive interference order in transmittance spectrum are used. The method is based on the minimizing procedure leading to the determination of interference order accurately by using reasonable Cauchy parameters. It was tested on theoretically generated transmittance spectrum of absorbing film and the details of the minimization procedure were discussed.
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    An Improved Method For The Determination Of Birefringence Dispersion Of Liquid Crystal Cell: A Simulation Study
    (Amer Inst Physics, 2016) Ozcan, Seckin; Coskun, Emre; Kocahan, Ozlem; Ozder, Serhat
    An improved approach to determine the birefringence dispersion of a liquid crystal cell was presented. Using the local maxima or minima of the transmittance spectrum of liquid crystal cell is a very convenient method for this aim with the proviso that at least one birefringence value must be known in advance from which the interference orders corresponding to maxima or minima are determined. Presented approach overcomes this problem. The improved method was based on the minimizing procedure leading to the determination of interference order and Cauchy parameters accurately. It was tested on a theoretically generated transmittance spectrum of liquid crystal cell and the details of the fitting procedure were discussed.
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    Simultaneous determination of the thickness and refractive index dispersion of dielectric films by the Paul wavelet transform
    (Elsevier Science Sa, 2019) Ozcan, Seckin; Coskun, Emre; Kocahan, Ozlem; Ozder, Serhat
    The continuous wavelet transform with Paul wavelet was proposed as a method for the simultaneous determination of physical thickness and refractive index dispersion of dielectric films in the visible and near infrared region. Transmittance spectrums, acquired at two different incident angles, were used for the calculations. By this way refractive index dispersion was obtained without knowing the film thickness. The method was tested with simulated data and experimentally applied to a sample of borosilicate glass. The obtained thickness and refractive index dispersion values were compared to the values obtained by the envelope method and the ones provided by the manufacturer.
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    Öğe
    The generalized Morse wavelet method to determine refractive index dispersion of dielectric films
    (Iop Publishing Ltd, 2017) Kocahan, Ozlem; Ozcan, Seckin; Coskun, Emre; Ozder, Serhat
    The continuous wavelet transform (CWT) method is a useful tool for the determination of refractive index dispersion of dielectric films. Mother wavelet selection is an important factor for the accuracy of the results when using CWT. In this study, generalized Morse wavelet (GMW) was proposed as the mother wavelet because of having two degrees of freedom. The simulation studies, based on error calculations and Cauchy Coefficient comparisons, were presented and also the noisy signal was tested by CWT method with GMW. The experimental validity of this method was checked by D263 T schott glass having 100 mu m thickness and the results were compared to those from the catalog value.